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Semiconductor AC Source

1.Power Range: 3kVA to 30kVA (Single & Three Phase)
2.Technology: High-Precision IGBT-based AC Source with Ultra-Low Noise and Fast Transient Response
3.Input: 1-Phase 220V or 3-Phase 380V, 50/60Hz
4.Output: 0-300V Adjustable, 45-500Hz Variable Frequency, Pure Sine Wave
5.Applications: Semiconductor Test, Wafer Probers, ATE Systems, Component Characterization
6.Core Features: Ultra-Low Output Noise, High Accuracy, Fast Settling Time, Programmable Transients
7.Brand: ACSOON (Rackmount or Benchtop Configurations).
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  • Product Description
 

Semiconductor AC Source | Precision AC Power for Semiconductor Test Equipment

 

XI'AN JERRYSTAR INSTRUMENT CO., LTD introduces the Semiconductor AC Source, a precision power instrument designed specifically for semiconductor test applications. This high-performance AC source delivers ultra‑clean, stable, and programmable power with fast transient response and exceptionally low output noise—critical for characterizing sensitive semiconductor devices, power ICs, and wafer‑level testing. Its compact form factor and remote control capabilities make it ideal for integration into automated test equipment (ATE) and research laboratories.

Semiconductor AC Source
Semiconductor AC Source
Semiconductor AC Source
 

Datasheet

 
ParameterSpecification
Model SeriesACSOON ACSW Series
Model NumberACSW-330030 (30kVA Three Phase)
Input1-Phase 220V or 3-Phase 380V/400V/415V ±15%, 50/60Hz
OutputVoltage: 0‑300V (L‑N) adjustable
Frequency: 45‑500Hz adjustable
Power: 3kVA, 6kVA, 10kVA, 15kVA, 20kVA, 30kVA (Three Phase)
Output THD<2% @ linear load (typical <1.5%)
RegulationVoltage: ≤ ±0.5% FS, Frequency: ≤ ±0.1% FS
Settling Time<100 ms (to within 1% of setpoint)
Efficiency≥85%
DisplayLCD Digital (V, I, F, P, PF)
CommunicationRS232, RS485 (Modbus, SCPI)
ProtectionsOver Voltage, Over Current, Short Circuit, Over Temperature
CoolingForced Air (Low‑Noise Fans)
Operating Temp.-10°C to 45°C
Semiconductor AC Source
 
 

Semiconductor AC Source Main Features

  • High Output Purity: THD <2% (typical <1.5%) ensures minimal interference with sensitive measurements.
  • Wide Adjustment Range: Voltage 0‑300V, frequency 45‑500Hz for testing across global standards.
  • Fast Settling Time: Achieves stable output within 100ms after load or setpoint change, reducing test time.
  • Comprehensive Protections: Built‑in over‑voltage, over‑current, and short‑circuit protection safeguard the device under test.
Semiconductor AC Source

Why Choose ACSOON Semiconductor AC Source?

  • Ultra-Low Output Noise: Exceptional low harmonic distortion and minimal high‑frequency noise ensure accurate measurements of semiconductor parameters.
  • Fast Transient Response: Responds quickly to load changes, essential for testing power management ICs and dynamic loads.
  • High Accuracy & Stability: Precise voltage and frequency regulation deliver repeatable results for device characterization.
  • ATE-Ready Integration: Standard RS232/RS485 interfaces and SCPI command set simplify integration into automated test systems.

Semiconductor AC Source Application Areas

  • Wafer Probers & ATE: Providing clean AC power for wafer‑level parametric testing and final package test.
  • Power IC Characterization: Testing AC‑DC converters, motor drivers, and power management ICs under controlled AC conditions.
  • Semiconductor Reliability Labs: Performing burn‑in, life test, and stress test with programmable voltage/frequency profiles.
  • Research & Development: Characterizing new semiconductor materials and devices with ultra‑clean AC power.
Application Areas

Our Services

Quality Control
01

Quality Control

  • Precision Calibration: Output voltage and frequency calibrated against NIST‑traceable standards.
  • Noise Performance Test: Output THD and high‑frequency noise measured in shielded environment.
  • Transient Response Validation: Load step tests performed to verify settling time and stability.
  • Full‑Load Burn-In: Each unit runs at rated power for 24 hours to ensure long‑term reliability.
02

R&D Results

  • Advanced Filter Topology: Developed multi‑stage filter for ultra‑low output noise across wide frequency range.

  • Fast DSP Control Loop: Engineered digital control with high‑speed feedback for sub‑millisecond transient response.

  • SCPI Command Set: Implemented standard commands for seamless integration with semiconductor test software.

  • Low‑EMI Design: Optimized layout and shielding to minimize electromagnetic interference with sensitive test equipment.

R&D Results
Packaging And Transportation
03

Packaging and Transportation

  • Laboratory‑Grade Packaging: Unit packed in anti‑static foam within double‑wall carton.

  • Accessory Kit: Includes power cord, communication cable, user manual, and calibration certificate.

  • Complete Documentation: Test reports, programming guide, and warranty card.

  • Global Shipping: Reliable carriers with full tracking and insurance.

04

After‑Sales Service

We offer an 18‑month warranty, technical support for ATE integration, firmware updates, and availability of spare parts.

After‑Sales Service

 ​​​​​​​Qualification Certification

ISO 9001:2015 Certified manufacturing;CE Marked for safety and EMC compliance;​​​​​​​Calibration Certificate: Provided with each unit traceable to national standards.

CE Certification
 
ISO Certification
 

FAQ

Q1: Why is output purity so critical for semiconductor testing?
A: High‑frequency noise and harmonic distortion can mask small‑signal behavior, cause false readings, or damage sensitive devices. An ultra‑clean AC source ensures test results reflect the device’s true performance.
Q2: Can this source simulate various power line conditions?
A: Yes, programmable voltage and frequency allow simulation of global mains (115V/60Hz, 230V/50Hz) as well as abnormal conditions like sags, swells, and frequency variations for stress testing.
Q3: How fast does it respond to load changes?
A: The unit achieves stable output within 100 ms after a load step, minimizing test time and ensuring accurate measurements during transient events.
Q4: Is it suitable for high‑volume production test?
A: Absolutely. With remote control, SCPI commands, and reliable design, it integrates easily into high‑throughput ATE systems.
Q5: What safety features protect the device under test?
A: Over‑voltage protection (adjustable), over‑current limiting, short‑circuit protection, and a programmable current foldback mode prevent damage to the device during abnormal conditions.

 

Contact Us

For technical specifications or global solutions for the Semiconductor AC Sourceacpower@acsoonpower.com, or submit your requirements using the form at the bottom of our website.

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